Smith, J, M Marrs, M Strnad, R Apte, J Bert, D Allee, N Colaneri, E Forsythe, and D Morton. 2013. Flexible Digital x-ray technology for far-forward remote diagnostic and conformal x-ray imaging applications. Proc. SPIE 8730, Flexible Electronics.
R.Vemuri, W. Mathews, M. Marrs, and T. Alford, “Investigation of Defect Generation and Annihilation in IGZO TFTs During Practical Stress Conditions: Illumination and Electrical Bias”, Journal of Physics D: Applied Physics, vol. 46 p. 045101, 2013.